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05.02.2024 | ELECTRICAL AND MAGNETIC PROPERTIES

Magneto-Optical Ellipsometry of Thin Films with Optical Uniaxial Anisotropy

verfasst von: O. A. Maximova, S. A. Lyaschenko, S. N. Varnakov, S. G. Ovchinnikov, I. A. Yakovlev, D. V. Shevtsov, T. A. Andryushchenko

Erschienen in: Physics of Metals and Metallography | Ausgabe 14/2023

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Abstract

In this paper, we solve the inverse problem of magneto-optical ellipsometry for thin ferromagnetic films with optical uniaxial anisotropy. We work within the framework of the approach we developed earlier analyzing magnetoellipsometric data without using fourth-order M-matrices. We work with ellipsometric relations, in which we take into account the magneto-optical contribution as perturbations, and ellipsometric measurements are carried out on a setup with a simple dipole scheme based on the transverse magneto-optical Kerr effect. We add the magneto-optical response to the expressions known in the literature for the reflection coefficients of anisotropic thin films, which are related to the parameters measured by magneto-optical ellipsometry. As a result, by analyzing the obtained expressions for the reflection coefficients, we obtain information on the total permittivity tensor of a thin film.

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Titel: Magneto-Optical Ellipsometry of Thin Films with Optical Uniaxial Anisotropy
verfasst von: O. A. Maximova
S. A. Lyaschenko
S. N. Varnakov
S. G. Ovchinnikov
I. A. Yakovlev
D. V. Shevtsov
T. A. Andryushchenko
Publikationsdatum: 05.02.2024
Verlag: Pleiades Publishing
Erschienen in: Physics of Metals and Metallography / Ausgabe 14/2023
Print ISSN: 0031-918X
Elektronische ISSN: 1555-6190
DOI: https://doi.org/10.1134/S0031918X23601385

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